Big data emergence in semiconductor manufacturing advanced process control As requirements on data volumes, rates, quality, merging and analytics increase exponentially in the digital universe, semiconductor manufacturers are faced with a need for new approaches to datamanagement and use across the fab. These are often termed “big data” challenges. In our industry bigdata solutions will be key to scaling Advanced Process Control (APC) solutions to finer levels of control and diagnostics. However the main impact will be to better enable more effective predictive technologies such as Predictive Maintenance (PdM), Virtual Metrology (VM) and yield prediction, all of which utilize data from APC capabilities. PdM represents one area where big data solutions are generating significant benefits across a variety of process types. Moving to big data solutions involves addressing the aforementioned requirements either with enhancements of existing systems or moving to more big data friendly platforms. The latter applied to APC systems provides quantifiable cost-of-ownership and speed improvements, thereby better enabling high quality prediction solutions.